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SAW Devices

Miniaturized and Lightweight SAW Devices for Base Stations

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Small and Lightweight SAW Devices

In recent years, base stations have become increasingly small and lightweight. As a result, demand has also increased for miniaturized and lightweight components. Kyocera offers highly reliable, miniaturized, and lightweight 2.5 x 2.0 mm size SAW devices.

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Reliability Test Conditions for Kyocera's SAW Devices

Test Items Conditions
Preconditioning 1) Temperature cycling: -40℃ to 60℃, 5 cycles
2) Baking: 125±5℃, 24 hrs
3) Moisture soak: soak time and conditions per IPC/JEDEC J-STD-020 based on device MSL level
4) Reflow: 3 reflow cycles using recommendable reflow profile
5) Drying: room ambient temperature
*Examination conducted per individual product
Temperature Cycling After preconditioning, subject the device to 700 cycles
(1 Cycle: -55℃ for 30 min, then +125℃ for 30 min)
*Examination conducted per individual product
After the test, the product was left at room temperature for at least 2 hours to check electrical characteristics and specifications.
ESD (Charged Device Model) Complies with JESD22-C101
ESD (Human Body Model) Complies with EIA/JESD22-A114
High Temperature Storage Life Subject the device to 150+/-2℃ for 1,000 hrs
*Examination conducted per individual product
After the test, the product was left at room temperature for at least 2 hours to check electrical characteristics and specifications.
High Temperature and Humidity Storage Life After preconditioning, subject the device to 85+/-2℃ and 85%RH for 1,000 hrs
*Examination conducted per individual product
After the test, the product was left at room temperature for at least 2 hours to check electrical characteristics and specifications.
Un-biased Temperature and Humidity After preconditioning, subject the device to 130+/-2℃ and 85%RH for 96 hrs
*Examination conducted per individual product
After the test, the product was left at room temperature for at least 2 hours to check electrical characteristics and specifications.
Vibration (Variable Frequency) 20Hz to 2kHz (log variation) in 4 min or over, 4X in each orientation, 50g peak acceleration, to test electrical characteristics and specifications.
Solderability Print lead-free solder paste on the terminal pattern of the device. Subject the device to recommendable reflow soldering. More than 90% of the terminal area shall be covered with solder to avoid abnormal appearance.

Kyocera's SAW Devices

Kyocera's SAW devices support high reliability for base stations and CPE (Customer Premises Equipment), device miniaturization, and industry-standard pin layouts.

Data is based on research by Kyocera.

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Product Lineup

Items Size Band Type IL (Tx) IL (Rx) Isolation Status Data Sheet
SD25-2140R9UUA1 2520 1 Unbalance 1.6dB typ*
(2110-2170MHz)
1.6dB typ**
(1920-1980MHz)
60dB typ** (1920-29809MHz)
57dB typ** (2110-2170MHz)
MP Click here for more information.
SD25-1842R9UUA1 2520 3 Unbalance 2.1dB typ**
(1805-1880MHz)
2.1dB typ**
(1710-1785MHz)
59dB typ* (1710-1785MHz)
61dB typ* (1805-1880MHz)
MP Click here for more information.
SD25-2655R9UUA1 2520 7 Unbalance 2.0dB typ*
(2620-2690MHz)
2.1dB typ**
(2500-2570MHz)
57dB typ** (2500-2570MHz)
57dB typ** (2620-2690MHz)
MP Click here for more information.
SD25-0942R9UUA1 2520 8 Unbalance 1.4dB typ**
(925-960MHz)
1.5dB typ**
(880-915MHz)
61dB typ** (880-915MHz)
53dB typ* (925-960MHz)
MP Click here for more information.
SD25-1962R9UUA1 2520 25 Unbalance 2.3dB typ*
(1930-1995MHz)
2.0dB typ**
(1850-1915MHz)
54dB typ** (1850-1915MHz)
54dB typ** (1930-1995MHz)
MP Click here for more information.
SD25-0780R9UUA1 2520 28 Unbalance 1.7dB typ**
(758-803MHz)
1.4dB typ**
(703-748MHz)
50dB typ** (703-748MHz)
50dB typ** (758-803MHz)
MP Click here for more information.
SD25-2155R9UUA1 2520 66 Unbalance 2.0dB typ*
(2110-2200MHz)
1.7dB typ**
(1710-1780MHz)
55dB typ** (1710-1780MHz)
54dB typ** (2110-2200MHz)
MP Click here for more information.

We offer our company's standard frequencies and specifications.

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